Meaning
Non-contact electromagnetic characterization technique evaluates material permittivity and permeability at sub-millimeter wavelengths using focused horn antennas and Gaussian beam optics. Testing high-frequency substrate panels relies on free space quasi optical measurement to obtain dielectric properties without machining physical test plugs. The apparatus directs a collimated RF beam through a flat material sample positioned between focused lens antennas.
Transmission and reflection coefficients yield complex constitutive parameters across broad frequency bands. The technique becomes invalid when sample dimensions drop below the diameter of the focused beam waist, causing diffraction around the material edges.
Optical Architecture
Dielectric lenses focus horn antenna radiation into narrow Gaussian beam profiles. Focusing the electromagnetic energy reduces edge diffraction and eliminates the need for conductive sample enclosures. Positioning the focal point precisely at the center of the sample plane ensures planar phase fronts.
Transmission Analysis
Vector network analyzers capture S-parameters from the transmitted and reflected beam waves. Processing these reflection and transmission coefficients through phase-unwrapping algorithms yields complex dielectric permittivity. Employing free space quasi optical measurement allows non-destructive testing of delicate thin-film substrates before final circuit fabrication.
Sample Alignment
Mechanical positioning accuracy governs phase measurement precision. Tilting the specimen relative to the beam axis introduces phase errors that corrupt loss tangent calculations. Flat optical fixtures hold the panel rigid to preserve phase front alignment.