
Surface Roughness Effects on Contact Resistance in High Frequency Test Sockets
Surface roughness forces high-frequency current through isolated micro-asperities, increasing contact resistance and insertion loss as skin depth shrinks.

Surface roughness forces high-frequency current through isolated micro-asperities, increasing contact resistance and insertion loss as skin depth shrinks.

Monitor probe contact resistance drift dynamically to replace worn pins before false failures corrupt production yield metrics and inflate testing costs.

Contact oxide growth adds up to 3 dB insertion loss in RF interconnects, degrading link margin and driving retransmissions unless wiping force exceeds 0.3 N.
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